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Hyper Quick Vision
White Light Interferometer
High accuracy for non-contact
dimensional measurement
White Light Interferometer
Using white light interferometer, the Quick Vision Series can perform highly accurate 3D measurements in microscopic areas for surface analysis, small-diameter hole depth, and line and space measurements on circuit boards.
NON-CONTACT
2D/3D MEASUREMENT
White light interferometer (WLI optical head) applied to vision measuring systems enables a wide range of powerful measurements, from 2D measurement of coordinates and dimensions, surface analysis in microscopic areas, depth measurement of small-diameter holes, and to high-precision 3D measurement of wiring dimensions on a printed circuit board.
A WIDE VARIETY OF
MEASUREMENT SURFACES
WLI method can handle a wide variety of measurement surfaces including diffusing surfaces and mirrored surfaces. Using Mitutoyo’s proprietary algorithm, WLI can also handle surfaces with large brightness differences, e.g., where plastic and metal coexist in mixed states.
QV3DPAK
Synthesizes 3D shape data from interference fringes to display shapes or outputs point cloud data to external sources. 3D data can be transferred to the shape/evaluation analysis software (optional) to implement shape measurement and surface analysis.